DocumentCode :
1591645
Title :
Analyses and solutions to unsafe testing states from boundary scan testing
Author :
Xiaopeng, Deng ; Simao, Xu
Author_Institution :
Software Eng. Center, Electron. Eng. Inst., Hefei, China
Volume :
4
fYear :
2011
Firstpage :
196
Lastpage :
199
Abstract :
IEEE 1149.1 standard provides an effective approach to testing circuit boards with physical limited access. Unsafe testing states may be occurred during the duration of boundary scan testing when both design-for-testing on circuit board and testing script are not perfect. Case studies on unsafe testing states occurred in the duration of boundary scan testing is provided based on our testing work performed over the recent years, reasons are analysed and solutions are proposed.
Keywords :
IEEE standards; boundary scan testing; circuit testing; design for testability; IEEE 1149.1 standard; boundary scan testing; circuit boards testing; design-for-testing; physical limited access; unsafe testing states; Discrete Fourier transforms; Embedded systems; Impedance; Pins; Printed circuits; Resistors; Testing; analysis; boundary scan testing; solution; unsafe testing state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
Type :
conf
DOI :
10.1109/ICEMI.2011.6037977
Filename :
6037977
Link To Document :
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