• DocumentCode
    1591645
  • Title

    Analyses and solutions to unsafe testing states from boundary scan testing

  • Author

    Xiaopeng, Deng ; Simao, Xu

  • Author_Institution
    Software Eng. Center, Electron. Eng. Inst., Hefei, China
  • Volume
    4
  • fYear
    2011
  • Firstpage
    196
  • Lastpage
    199
  • Abstract
    IEEE 1149.1 standard provides an effective approach to testing circuit boards with physical limited access. Unsafe testing states may be occurred during the duration of boundary scan testing when both design-for-testing on circuit board and testing script are not perfect. Case studies on unsafe testing states occurred in the duration of boundary scan testing is provided based on our testing work performed over the recent years, reasons are analysed and solutions are proposed.
  • Keywords
    IEEE standards; boundary scan testing; circuit testing; design for testability; IEEE 1149.1 standard; boundary scan testing; circuit boards testing; design-for-testing; physical limited access; unsafe testing states; Discrete Fourier transforms; Embedded systems; Impedance; Pins; Printed circuits; Resistors; Testing; analysis; boundary scan testing; solution; unsafe testing state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8158-3
  • Type

    conf

  • DOI
    10.1109/ICEMI.2011.6037977
  • Filename
    6037977