DocumentCode
1591645
Title
Analyses and solutions to unsafe testing states from boundary scan testing
Author
Xiaopeng, Deng ; Simao, Xu
Author_Institution
Software Eng. Center, Electron. Eng. Inst., Hefei, China
Volume
4
fYear
2011
Firstpage
196
Lastpage
199
Abstract
IEEE 1149.1 standard provides an effective approach to testing circuit boards with physical limited access. Unsafe testing states may be occurred during the duration of boundary scan testing when both design-for-testing on circuit board and testing script are not perfect. Case studies on unsafe testing states occurred in the duration of boundary scan testing is provided based on our testing work performed over the recent years, reasons are analysed and solutions are proposed.
Keywords
IEEE standards; boundary scan testing; circuit testing; design for testability; IEEE 1149.1 standard; boundary scan testing; circuit boards testing; design-for-testing; physical limited access; unsafe testing states; Discrete Fourier transforms; Embedded systems; Impedance; Pins; Printed circuits; Resistors; Testing; analysis; boundary scan testing; solution; unsafe testing state;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8158-3
Type
conf
DOI
10.1109/ICEMI.2011.6037977
Filename
6037977
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