• DocumentCode
    1591750
  • Title

    On verifying the correctness of retimed circuits

  • Author

    Huang, Shi-Yu ; Cheng, Kwang-Ting ; Chen, Kuang-Chien

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1996
  • Firstpage
    277
  • Lastpage
    280
  • Abstract
    We address the problem of verifying a retimed circuit. After retiming, some latches in a sequential circuit are repositioned to reduce the clock cycle time and thus the behavior of the combinational portion is changed. Here, we present a novel approach to check the correctness of a retimed circuit according to the definition of 3-valued equivalence. This approach is based on our verification framework using sequential ATPG techniques. We further incorporate an algorithm to pre-process the circuits and make the verification process even more efficient. We will present the experimental results of verifying the retimed circuits with hundreds of flip-flops on ISCAS89 benchmark circuits to show its capability
  • Keywords
    automatic testing; clocks; flip-flops; integrated circuit testing; logic testing; sequential circuits; ISCAS89 benchmark circuits; clock cycle time; correctness verification; flip-flops; retimed circuits; sequential ATPG techniques; sequential circuit; three-valued equivalence; verification framework; Automatic test pattern generation; Boolean functions; Circuit simulation; Clocks; Data structures; Formal verification; Latches; Logic circuits; Sequential circuits; State-space methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on
  • Conference_Location
    Ames, IA
  • ISSN
    1066-1395
  • Print_ISBN
    0-8186-7502-0
  • Type

    conf

  • DOI
    10.1109/GLSV.1996.497633
  • Filename
    497633