DocumentCode
1591750
Title
On verifying the correctness of retimed circuits
Author
Huang, Shi-Yu ; Cheng, Kwang-Ting ; Chen, Kuang-Chien
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear
1996
Firstpage
277
Lastpage
280
Abstract
We address the problem of verifying a retimed circuit. After retiming, some latches in a sequential circuit are repositioned to reduce the clock cycle time and thus the behavior of the combinational portion is changed. Here, we present a novel approach to check the correctness of a retimed circuit according to the definition of 3-valued equivalence. This approach is based on our verification framework using sequential ATPG techniques. We further incorporate an algorithm to pre-process the circuits and make the verification process even more efficient. We will present the experimental results of verifying the retimed circuits with hundreds of flip-flops on ISCAS89 benchmark circuits to show its capability
Keywords
automatic testing; clocks; flip-flops; integrated circuit testing; logic testing; sequential circuits; ISCAS89 benchmark circuits; clock cycle time; correctness verification; flip-flops; retimed circuits; sequential ATPG techniques; sequential circuit; three-valued equivalence; verification framework; Automatic test pattern generation; Boolean functions; Circuit simulation; Clocks; Data structures; Formal verification; Latches; Logic circuits; Sequential circuits; State-space methods;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on
Conference_Location
Ames, IA
ISSN
1066-1395
Print_ISBN
0-8186-7502-0
Type
conf
DOI
10.1109/GLSV.1996.497633
Filename
497633
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