DocumentCode :
1591901
Title :
Analog circuit fault diagnosis approach using optimized SVMs based on MST algorithm
Author :
Song Guoming ; Jiang Shuyan ; Wang Houjun ; Hong, Liu
Author_Institution :
Dept. of Comput. Eng., Chengdu Electromech. Coll., Chengdu, China
Volume :
4
fYear :
2011
Firstpage :
236
Lastpage :
240
Abstract :
The classification accuracy and efficiency of multiclass SVMs are largely dependent on the SVM combination strategy in analog circuits fault diagnosis. An optimized SVM extension strategy is presented in this paper, which uses minimum spanning tree (MST) algorithm to simplify the SVM structure and decrease the classification errors. By taking the separability measure of fault classes as edge weight of undirected graph extracted from feature space, the tree nodes are generated by bottom-top method, which represents sub-class partition with clustering characteristic. Finally, hierarchical multiclass SVMs are constructed according to the structure of MST obtained. The MST-SVM classifier is expected to improve the diagnosis accuracy because the fault classes with larger margin are preferentially separated. The experimental results on a high-pass filter circuit prove that the MST-SVM method outperforms other conventional SVM approaches in veracity and efficiency of fault diagnosis.
Keywords :
analogue circuits; circuit analysis computing; circuit testing; fault diagnosis; feature extraction; high-pass filters; pattern classification; pattern clustering; support vector machines; trees (mathematics); SVM combination strategy; SVM structure; analog circuit fault diagnosis; bottom-top method; classification accuracy; classification error; clustering characteristics; edge weight; fault class; feature space; hierarchical multiclass SVM; high-pass filter circuit; minimum spanning tree algorithm; optimized SVM; separability measure; subclass partition; tree nodes; undirected graph; Accuracy; Analog circuits; Circuit faults; Fault diagnosis; Support vector machines; Testing; Training; MST algorithm; SVM classifier; analog circuits; fault diagnosis; separability measure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
Type :
conf
DOI :
10.1109/ICEMI.2011.6037986
Filename :
6037986
Link To Document :
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