Title :
Flexible silicon interconnects for microelectromechanical systems
Author :
Hetke, J.F. ; Najafi, K. ; Wise, K.D.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
Flexible, multilead silicon-substrate cables have been developed for connection to a variety of sensors and microelectromechanical systems. These cables are fully shielded, have been fabricated with multiple strands, and are very flexible due to the thin (2.5- mu m) silicon substrate that supports the leads. Five-lead cables with a total thickness of 5 mu m have been fabricated with lengths ranging from 2.5 to 5 cm. These cables are very flexible and yet very strong. Soak tests in buffered saline under electrical and mechanical stress show leakage currents in the sub-picoamp range after over 175 days under +or-5-V bias. Cables integrated into multichannel silicon neural recording probes have been implanted in guinea pigs and remain functional after over four months in-vivo, maintaining impedance levels in the 3-9-M Omega range. The authors present the structure and process for these shielded cables and review the electrical and mechanical characteristics of the cables, including the results of biased soak tests in saline.<>
Keywords :
biosensors; cables (electric); electric sensing devices; elemental semiconductors; encapsulation; micromechanical devices; silicon; buffered saline; electrical stress; elemental semiconductor; flexible Si interconnects; impedance levels; implanted in guinea pigs; leakage currents; mechanical stress; microelectromechanical systems; multichannel neural recording probes; multilead Si substrate cables; multiple strands; shielded cables; soak tests; sub-picoamp range; Cable shielding; Impedance; Leakage current; Mechanical cables; Microelectromechanical systems; Probes; Sensor systems; Silicon; Stress; Testing;
Conference_Titel :
Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-585-7
DOI :
10.1109/SENSOR.1991.148994