Title :
Measurement of the mass density evolution of wire explosion using X-ray backlighting
Author :
Xinlei Zhu ; Xiaobing Zou ; Ran Zhang ; Haiyun Luo ; Shen Zhao ; Xinxin Wang
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Abstract :
Summary form only given. The evolution of single-wire and dual-wire Z-pinch of 8μm-W were investigated by X-ray backlighting using the X-pinch which radiated a soft X-ray source. The experiments were carried out on the pulsed power generator PPG-I (400kA/500kV/100ns) which was designed and constructed by Department of Electrical Engineering of Tsinghua University. In order to scale the mass distribution at different explosion time, a mass step wedge including eight tungsten layers was fabricated and inserted between the object Z-pinch and the X-ray film. By a large number of imaging experiments, the physical images of the plasma merging, the coronal plasma formation and development of the instabilities of Z-pinch and some important parameters like mass ablation ratio and core expansion ratio were obtained. The mass density distributions at different explosion time were drawn based on the x-ray photos of 8μm-W and step wedge. The conductance curve of time-dependence of 8μm-W was also calculated using waveform of voltage and current.
Keywords :
Z pinch; density measurement; mass measurement; plasma X-ray sources; plasma diagnostics; plasma sources; tungsten; Department of Electrical Engineering; Tsinghua University; W; X-pinch; X-ray backlighting; X-ray film; X-ray photo; core expansion ratio; coronal plasma formation; current 400 kA; dual-wire Z-pinch instability; mass ablation ratio; mass density distribution; mass density evolution measurement; mass step wedge; plasma physical image; pulsed power generator; radiation; single-wire Z-pinch instability; soft X-ray source; time 100 ns; voltage 500 kV; wire explosion; Density measurement; Educational institutions; Electric variables measurement; Electrical engineering; Explosions; Plasmas; X-ray imaging;
Conference_Titel :
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location :
San Francisco, CA
DOI :
10.1109/PLASMA.2013.6634830