Title :
Free carrier absorption loss on p-i-n and n-p-n silicon phase modulator at λ=1.3µm and λ=1.55µm
Author :
Hanim, A.R. ; Hazura, H. ; Mardiana, B. ; Menon, P.S.
Author_Institution :
Inst. of Micro Eng. & Nanoelectron. (IMEN), Univ. Kebangsaan Malaysia (UKM), Bangi, Malaysia
Abstract :
The paper reports on the free carrier absorption loss associated with silicon phase modulator. Two structures are compared: p-i-n and n-p-n structure. The simulations are realized utilizing the 2-D semiconductor simulation package SILVACO. Simulations predict that both structures operate more efficiently at 1.3 μm in terms of free carrier absorption loss. At 1.3 μm, the calculated free carrier absorption loss for p-i-n structure is 0.1149 dB, while n-p-n structure suffers 0.3956 dB of loss. Structure-wise, n-p-n silicon phase modulator experience more free carrier absorption loss compared to p-i-n structure due to extra doping contact.
Keywords :
elemental semiconductors; integrated optics; optical modulation; phase modulation; semiconductor doping; silicon; 2D semiconductor simulation; SILVACO; Si; doping contact; free carrier absorption loss; n-p-n silicon phase modulator; p-i-n silicon phase modulator; wavelength 1.3 mum; wavelength 1.55 mum; Absorption; Charge carrier processes; Electron mobility; Optical losses; Optical refraction; Optical waveguides; PIN photodiodes; Phase modulation; Refractive index; Silicon;
Conference_Titel :
Semiconductor Electronics (ICSE), 2010 IEEE International Conference on
Conference_Location :
Melaka
Print_ISBN :
978-1-4244-6608-5
DOI :
10.1109/SMELEC.2010.5549520