• DocumentCode
    1592654
  • Title

    The New Scaling Paradigm

  • Author

    Gargini, Paolo A.

  • Author_Institution
    ITRS Chairman, IEEE Fellow, Director Technology Strategy, Intel Fellow
  • fYear
    2008
  • Firstpage
    10
  • Lastpage
    13
  • Abstract
    The FET device will lead the Silicon Nanoelectronics era until at least the beginning of the third decade of the 21st century by using the equivalent scaling approach. New process techniques like self-assembly will be required to augment the capabilities of the traditional evolution of top-down manufacturing techniques. Multiple materials will be introduced in the FET process and eventually all of the materials introduced in the 60´s will be replaced, including possibly silicon itself. Thermal limitations will most likely represent the ultimate limitation of the FET device requiring the adoption of heterogeneous integration of multiple technologies on the same substrate as a way of achieving higher system performance. Devices using other quantum state variables have been proposed and an extensive and systematic evaluation program needs to be carried on in this decade in order to identify possible candidates in the next decade for manufacturing implementation beyond the year 2020. This new device will operate in conjunction with CMOS and other types of devices in a heterogeneous integration.
  • Keywords
    CMOS integrated circuits; MOSFET; elemental semiconductors; nanoelectronics; self-assembly; semiconductor device manufacture; silicon; CMOS process; FET device; Si; equivalent scaling approach; multiple technologies integration; quantum state variables; self-assembly process techniques; silicon nanoelectronics; systematic evaluation program; Aluminum; Application software; Dielectrics; Electron tubes; Electronics industry; FETs; Gold; MOS devices; MOSFETs; Silicides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    978-1-4244-1614-1
  • Electronic_ISBN
    1524-766X
  • Type

    conf

  • DOI
    10.1109/VTSA.2008.4530775
  • Filename
    4530775