• DocumentCode
    1592844
  • Title

    Film uniformly in bond and etch-back silicon on insulator (BESOI)

  • Author

    Hunt, Charles E.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Davis, CA, USA
  • fYear
    1988
  • Firstpage
    57
  • Abstract
    BESOI is made epitaxially growing a high-resistivity layer on a low-resistivity substrate, oxidizing the epilayer, and then thermally bonding a second oxidized wafer (the handle) onto the oxidized epilayer. The SOI film is then formed by etching the original substrate up to the epilayer, leaving the handle as the new substrate. The major incentive for using this technology is the thermal Si/SiO2 interface between the SOI layer and the insulator. The author discusses briefly film thickness problems and the techniques whereby they can be minimized
  • Keywords
    field effect integrated circuits; semiconductor epitaxial layers; semiconductor technology; semiconductor-insulator boundaries; BESOI; SOI film; SOI layer; Si-SiO2; bond and etch-back silicon on insulator; film thickness problems; film uniformity; high-resistivity layer; low-resistivity substrate; oxidized epilayer; thermal Si/SiO2 interface; wafer bonding; Bonding; Etching; Semiconductor films; Silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOS/SOI Technology Workshop, 1988. Proceedings., 1988 IEEE
  • Conference_Location
    St. Simons Island, GA
  • Type

    conf

  • DOI
    10.1109/SOI.1988.95429
  • Filename
    95429