DocumentCode
1592844
Title
Film uniformly in bond and etch-back silicon on insulator (BESOI)
Author
Hunt, Charles E.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Davis, CA, USA
fYear
1988
Firstpage
57
Abstract
BESOI is made epitaxially growing a high-resistivity layer on a low-resistivity substrate, oxidizing the epilayer, and then thermally bonding a second oxidized wafer (the handle) onto the oxidized epilayer. The SOI film is then formed by etching the original substrate up to the epilayer, leaving the handle as the new substrate. The major incentive for using this technology is the thermal Si/SiO2 interface between the SOI layer and the insulator. The author discusses briefly film thickness problems and the techniques whereby they can be minimized
Keywords
field effect integrated circuits; semiconductor epitaxial layers; semiconductor technology; semiconductor-insulator boundaries; BESOI; SOI film; SOI layer; Si-SiO2; bond and etch-back silicon on insulator; film thickness problems; film uniformity; high-resistivity layer; low-resistivity substrate; oxidized epilayer; thermal Si/SiO2 interface; wafer bonding; Bonding; Etching; Semiconductor films; Silicon on insulator technology;
fLanguage
English
Publisher
ieee
Conference_Titel
SOS/SOI Technology Workshop, 1988. Proceedings., 1988 IEEE
Conference_Location
St. Simons Island, GA
Type
conf
DOI
10.1109/SOI.1988.95429
Filename
95429
Link To Document