DocumentCode :
1593068
Title :
Reliability design of campus ELT network
Author :
Yifei, Zhang ; Jiamu, Niu
Author_Institution :
Beihua University, Jilin City, China
fYear :
2012
Firstpage :
1
Lastpage :
4
Abstract :
Reliability is a key technical indicator evaluating the overall performance of campus ELT network. With the acceleration of the process of digital campus construction, building a high reliable ELT network without single point of failure has become the core of digital campus. Based on the theory of computer network reliability, this article describes the optimal reliability design of campus ELT network from the technological angle of perfection, fault tolerance and network architecture.
Keywords :
ELT network; fault tolerance; network architecture; perfection; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
World Automation Congress (WAC), 2012
Conference_Location :
Puerto Vallarta, Mexico
ISSN :
2154-4824
Print_ISBN :
978-1-4673-4497-5
Type :
conf
Filename :
6321784
Link To Document :
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