Title :
Reliability design of campus ELT network
Author :
Yifei, Zhang ; Jiamu, Niu
Author_Institution :
Beihua University, Jilin City, China
Abstract :
Reliability is a key technical indicator evaluating the overall performance of campus ELT network. With the acceleration of the process of digital campus construction, building a high reliable ELT network without single point of failure has become the core of digital campus. Based on the theory of computer network reliability, this article describes the optimal reliability design of campus ELT network from the technological angle of perfection, fault tolerance and network architecture.
Keywords :
ELT network; fault tolerance; network architecture; perfection; reliability;
Conference_Titel :
World Automation Congress (WAC), 2012
Conference_Location :
Puerto Vallarta, Mexico
Print_ISBN :
978-1-4673-4497-5