DocumentCode :
1593133
Title :
Novel Silicon Surface Pre-Treatment (SSPT) Technique for CMOS Device Performance Boosting
Author :
Lee, Da-Yuan ; Chen, C.C. ; Huang, C.H. ; Lim, P.S. ; Chan, M.H. ; Yeh, M.S. ; Huang, C.S. ; Tao, H.J. ; Mii, YJ
Author_Institution :
Taiwan Semicond. Manuf. Co., Hsinchu
fYear :
2008
Firstpage :
42
Lastpage :
43
Abstract :
In this paper, a novel surface treatment technique using Silicon Surface Pre-Treatment (SSPT) technique to boost high performance CMOS circuit is reported. This approach provides a smooth silicon surface and extends the effective channel width to enhance device performance on both N and PMOSFET In this work, a smooth and rounded active area (AA) surface was successfully fabricated. Using this technique, we demonstrated a significant device boost of 15% and 7% on small dimension N and PMOSFET, respectively. These achievements were demonstrated without negative impact on GOI and NBTI.
Keywords :
MOS integrated circuits; MOSFET; elemental semiconductors; silicon; surface treatment; CMOS circuit; NMOSFET; PMOSFET; Si; effective channel width; rounded active area surface; silicon surface pre-treatment; smooth active area surface; Boosting; CMOS technology; Interface states; MOSFET circuits; Niobium compounds; Rough surfaces; Silicon; Surface roughness; Surface topography; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on
Conference_Location :
Hsinchu
ISSN :
1524-766X
Print_ISBN :
978-1-4244-1614-1
Electronic_ISBN :
1524-766X
Type :
conf
DOI :
10.1109/VTSA.2008.4530790
Filename :
4530790
Link To Document :
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