Title :
Automated test data development for semi-custom ICs: An ideal approach to fast development
Author_Institution :
Application Specific Product Group Philips Semicond., Sunnyvale, CA, USA
Abstract :
With the advent of high performance technologies (sub-micron CMOS, BiCMOS, and BiNMOS), the practicality of automated test data development will be emphasized. Although automatic test pattern generation and timing analysis are currently considered desirable, the complexity and size of future ICs will make them mandatory. The author describes a new trend in test data development for a complex semi-custom IC and the benefits of that methodology through the development of an ASSP (application specific standard product)
Keywords :
application specific integrated circuits; automatic test software; circuit CAD; circuit analysis computing; design for testability; integrated circuit testing; logic CAD; logic testing; timing; ASIC; application specific standard product; automated test data development; automatic test pattern generation; fast development; functional test; semi-custom IC; timing analysis; timing verification; Application specific integrated circuits; Automatic testing; CMOS technology; Delay estimation; Integrated circuit testing; Logic design; Logic testing; Standards development; System-level design; Timing;
Conference_Titel :
ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-1375-5
DOI :
10.1109/ASIC.1993.410807
