Title :
Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults
Author :
Vongpradhip, Sartid ; Ginige, Athula
Author_Institution :
Sch. of Electr. Eng., Univ. of Technol., Sydney, Australia
Abstract :
A basis (framework) for comparing different testability measures was developed. Using this method testability values obtained for a set of ISCAS85 benchmark circuits using STAFAN and SCOAP techniques were compared. Also the authors extended the statistical testability analysis technique to cover transient (delay) faults and compared the results with values from a probabilistic technique. They observed that the values from their technique generally agree with the values from the probabilistic model
Keywords :
application specific integrated circuits; automatic test software; delays; design for testability; fault diagnosis; logic testing; probability; statistical analysis; transient analysis; ASIC; ATPG; I/O detectability; ISCAS85 benchmark circuits; SCOAP; STAFAN; correlation; delay faults; probabilistic technique; statistical testability analysis; stuck at faults; testability measures comparison; transient faults; Automatic test pattern generation; Benchmark testing; Circuit analysis; Circuit faults; Circuit testing; Delay; Scattering; System testing; Systems engineering and theory; Transient analysis;
Conference_Titel :
ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-1375-5
DOI :
10.1109/ASIC.1993.410808
