Title :
Low-loss waveguide crossings for photonic integrated circuits on SOI technology
Author :
Celo, D. ; Goodwill, D.J. ; Dumais, Patrick ; Jiang, Jianliang ; Bernier, Eric
Author_Institution :
Huawei Technol. Canada, Kanata, ON, Canada
Abstract :
This paper reports experimental results on compact, low-loss and broadband optical waveguide crossing structures fabricated in a CMOS-compatible process. Insertion loss of 0.11 dB/crossing and crosstalk below -45 dB are achieved in devices with 6.5 × 6.5 μm2 footprint.
Keywords :
integrated optics; optical crosstalk; optical fabrication; optical losses; optical waveguides; silicon-on-insulator; CMOS-compatible process; SOI technology; broadband optical waveguide crossing structures; crosstalk; insertion loss; loss 11 dB; low-loss waveguide crossings; photonic integrated circuits; Insertion loss; Optical crosstalk; Optical device fabrication; Optical imaging; Optical losses; Optical waveguides;
Conference_Titel :
Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4799-2282-6
DOI :
10.1109/Group4.2014.6961984
