• DocumentCode
    159365
  • Title

    Study of induced strain in silicon rib structures

  • Author

    Marini, D. ; Montanari, G.B. ; Mancarella, F. ; Ferri, M. ; Balboni, R. ; Bolognini, G.

  • Author_Institution
    Consiglio Naz. delle Ric., IMM Inst., Bologna, Italy
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    195
  • Lastpage
    196
  • Abstract
    This paper reports a theoretical and experimental study on induced strain in silicon-based rib structures. Simulations of induced stress and strain distribution were performed for nitride-strained silicon; moreover, locally-accurate strain measurements were performed on manufactured rib structures in proximity of the nitride-to-silicon interface employing the Convergent Beam Electron Diffraction (CBED) technique. The study resulted in good accordance between simulated and measured strain behaviors along the rib cross-section, indicating the possibility to achieve significant strain levels (e.g. higher than 2 mε for the εzz strain tensor component).
  • Keywords
    optical planar waveguides; rib waveguides; silicon; stress-strain relations; CBED; Si; convergent beam electron diffraction technique; induced strain; nitride-strained silicon; rib cross-section; silicon rib structures; strain distribution; stress distribution; Diffraction; Lattices; Optical variables measurement; Silicon; Strain; Strain measurement; Stress; All-optical networks; Integrated optics; Optical switching devices; strained silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-2282-6
  • Type

    conf

  • DOI
    10.1109/Group4.2014.6961987
  • Filename
    6961987