DocumentCode
1593970
Title
Determining the worst-case reaction time of IEC 61499 function blocks
Author
Kuo, Matthew M Y ; Yoong, Li Hsien ; Andalam, Sidharta ; Roop, Partha S.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Auckland, Auckland, New Zealand
fYear
2010
Firstpage
1104
Lastpage
1109
Abstract
The IEC 61499 is an international standard for describing industrial process-control systems. Such systems typically consist of embedded computers that interact closely with physical processes within a feedback loop. In order to correctly control these physical processes, computations in response to inputs need to be done in a timely manner. A program´s worst-case reaction time (WCRT) to inputs is usually used to ensure that timing constraints are met. Unfortunately, the standard has no provisions for specifying real-time constraints. Moreover, typical implementations of IEC 61499 are tightly coupled to their runtime environments-each with possibly different semantics and temporal properties-which makes it difficult to automate the estimation of their WCRTs. We propose to adopt a synchronous model for IEC 61499 programs. This allows the programs to be executed without the need of a run-time environment. Consequently, we are able to use a novel model-checking technique to estimate the WCRT of IEC 61499 programs. Experimental results on a suite of programs show that this approach provides conservative estimates that are, on average, less than 10 percent off from the actual WCRT.
Keywords
IEC standards; control engineering computing; feedback; formal verification; process control; IEC 61499 function blocks; embedded computers; feedback loop; industrial process-control systems; model-checking technique; worst-case reaction time; Automatic control; Computer industry; Control systems; Electrical equipment industry; IEC standards; Physics computing; Process control; Programmable control; Runtime environment; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Informatics (INDIN), 2010 8th IEEE International Conference on
Conference_Location
Osaka
Print_ISBN
978-1-4244-7298-7
Type
conf
DOI
10.1109/INDIN.2010.5549585
Filename
5549585
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