• DocumentCode
    1594063
  • Title

    Hybrid wafer for multi-layer integration mems devices

  • Author

    Sonoda, Koji ; Tanaka, Shinya ; Fujita, Takayuki ; Higuchi, Kohei ; Maenaka, Kazusuke

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Hyogo, Himeji, Japan
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    It reports on the exploratory experiment of a hybrid wafer with two or more die wired for each other in this thesis. The cavity is formed to the wafer, and individual die is arranged there (die is MEMS device and LSIs, etc.). The surface of the wafer and the surface of the dies are made smooth with the resin, and flat wiring is done to the electrode pads of individual die by the photolithography technology. The accumulating mounting to which other wafers are sticked together in using the flip-chip technology and the TSV technology on the wafer can be done. As a result, it becomes possible to raise the package density from a past wafer-level packaging technology further.
  • Keywords
    flip-chip devices; micromechanical devices; photolithography; resins; three-dimensional integrated circuits; wafer level packaging; TSV technology; electrode pads; flat wiring; flip-chip technology; hybrid wafer; multilayer integration MEMS devices; package density; past wafer-level packaging technology; photolithography technology; resin; Bonding; Cavity resonators; Integrated circuits; Micromechanical devices; Packaging; Wire; Wiring; Hybrid wafer; Wafer-Level Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    World Automation Congress (WAC), 2010
  • Conference_Location
    Kobe
  • ISSN
    2154-4824
  • Print_ISBN
    978-1-4244-9673-0
  • Electronic_ISBN
    2154-4824
  • Type

    conf

  • Filename
    5665588