Title :
Long-wavelength silicon photonic integrated circuits
Author :
Roelkens, Gunther ; Dave, Utsav ; Gassenq, A. ; Hattasan, N. ; Hu, Chuanmin ; Kuyken, Bart ; Leo, F. ; Malik, Anuj ; Muneeb, M. ; Ryckeboer, E. ; Sanchez, Dominick ; Uvin, S. ; Wang, Ruiqi ; Hens, Zeger ; Baets, Roel ; Shimura, Y. ; Gencarelli, F. ; Vince
Author_Institution :
IMEC, Photonics Res. Group, Ghent Univ., Ghent, Belgium
Abstract :
In this paper we elaborate on our development of silicon photonic integrated circuits operating at wavelengths beyond the telecommunication wavelength window. Silicon-on-insulator waveguide circuits up to 3.8 μm wavelength are demonstrated as well as germanium-on-silicon waveguide circuits operating in the 5-5 μm wavelength range. The heterogeneous integration of III-V semiconductors and IV-VI semiconductors on this platform is described for the integration of lasers and photodetectors operating in the 2-3 μm wavelength range. GeSn is proposed as an appealing approach to monolithically integrated long-wavelength detectors. Finally, nonlinear optics in silicon waveguide circuits beyond the two-photon absorption threshold is explored.
Keywords :
III-V semiconductors; IV-VI semiconductors; elemental semiconductors; germanium; germanium alloys; integrated optics; optical Kerr effect; optical waveguides; photodetectors; semiconductor lasers; silicon; silicon-on-insulator; tin alloys; two-photon spectra; Ge-Si; GeSn; III-V semiconductors; IV-VI semiconductors; germanium-on-silicon waveguide circuits; heterogeneous integration; lasers; long-wavelength silicon photonic integrated circuits; monolithically integrated long-wavelength detectors; nonlinear optics; photodetectors; silicon-on-insulator waveguide circuits; two-photon absorption threshold; Absorption; Arrayed waveguide gratings; Silicon photonics; Waveguide lasers; Silicon photonics; mid-infrared; spectroscopy;
Conference_Titel :
Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4799-2282-6
DOI :
10.1109/Group4.2014.6962009