Title :
Mid-infrared ultra-short pulses nonlinear measurement of SiGe waveguides
Author :
Carletti, L. ; Monat, Christelle ; Sinobad, M. ; Ma, Ping ; Yu, Yen-Ting ; Luther-Davies, Barry ; Madden, Steve ; Moss, David J. ; Brun, Marcel ; Ortiz, S. ; Nicoletti, S. ; Grillet, C.
Author_Institution :
Ecole Centrale de Lyon, Univ. of Lyon, Ecully, France
Abstract :
We report nonlinear measurements of SiGe waveguides in the mid-IR performed in the picosecond and femtosecond regime and compare the results to numerical calculations. Nonlinear properties of SiGe waveguides in the mid-IR are extracted.
Keywords :
Ge-Si alloys; nonlinear optics; optical waveguides; semiconductor materials; SiGe; femtosecond regime; mid-IR regime; mid-infrared ultrashort pulse nonlinear measurement; picosecond regime; waveguides; Absorption; Nonlinear optics; Optical waveguides; Photonics; Silicon; Silicon germanium; Ultrafast optics;
Conference_Titel :
Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4799-2282-6
DOI :
10.1109/Group4.2014.6962010
