Title :
Experimental demonstration of TM lateral leakage in a standard SOI photonics platform
Author :
Hope, Anthony P. ; Nguyen, Thach G. ; Bogaerts, W. ; Mitchell, A.
Author_Institution :
ARC Centre of Excellence for Ultrahigh bandwidth Devices for Opt. Syst. (CUDOS) & Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
Abstract :
We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides.
Keywords :
etching; integrated optics; optical fabrication; optical losses; optical waveguides; ridge waveguides; silicon-on-insulator; Si; TM lateral leakage; fundamental TM guided mode; shallow etched ridge waveguides; silicon-on-insulator; standard SOI photonics platform; width dependent losses; Couplers; Gratings; Optical losses; Optical waveguides; Photonics; Slabs; Standards;
Conference_Titel :
Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4799-2282-6
DOI :
10.1109/Group4.2014.6962028
