Title :
The Multi-resolution Technology for the X-ray Coherent Scatter Image
Author :
Liu, Taihui ; Li, Yanhong ; Xue, Jingli ; Liu, Xixiang
Author_Institution :
Comput. Coll., Beihua Univ., Jilin, China
Abstract :
In this paper, a series of x-ray coherent scatter images have been simulated with the Gaussian distribution theory. The traditional method and the Multi-resolution measure were taken to extract the spectrum curve from images. The comparative results of two methods show that the Multi-resolution is an effective, simple, reliable measure. It confirms the application of Multi-resolution in coherent scatter research before. The Multi-resolution method provides a new way for analysis of the x-ray coherent scatter images.
Keywords :
Gaussian distribution; X-ray scattering; image resolution; materials science computing; Gaussian distribution theory; X-ray coherent scatter image; multiresolution and line-scan algorithm; multiresolution technology; spectrum curve; Band pass filters; Educational institutions; Gaussian distribution; Materials; Noise; Reliability; X-ray imaging; Coherent scatter; Gaussian distribution; Multi-resolution analysis; Spectrum; X-ray;
Conference_Titel :
Intelligent System Design and Engineering Application (ISDEA), 2012 Second International Conference on
Conference_Location :
Sanya, Hainan
Print_ISBN :
978-1-4577-2120-5
DOI :
10.1109/ISdea.2012.577
