Abstract :
The following topics are dealt with: soft errors; error detection; error correction; nanoscale circuits; reliability; low-power test; fault-tolerant design; mixed-signals systems; asynchronous systems; EDA tools; delay-fault testing; power systems; networks on chip; VLSI; nanotechnology systems; and circuit defect.
Keywords :
VLSI; error correction; error detection; fault tolerance; integrated circuit design; integrated circuit reliability; integrated circuit testing; low-power electronics; mixed analogue-digital integrated circuits; nanoelectronics; network-on-chip; radiation hardening (electronics); EDA tools; VLSI; asynchronous systems; circuit defect; delay-fault testing; error correction; error detection; fault-tolerant design; low-power test; mixed-signals systems; nanoscale circuits; nanotechnology systems; networks on chip; power systems; reliability; soft errors;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4799-6154-2
DOI :
10.1109/DFT.2014.6962058
