Designs and analysis of non-volatile memory cells for single event upset (SEU) tolerance

This paper proposes a comprehensive approach to the designs of low-power non-volatile (NV) memory cells and for attaining Single Event Upset (SEU) tolerance. Three low-power hardened NVSRAM cell designs are proposed; these designs increase the critical charge and decrease power consumption by providing a positive (virtual) ground level voltage. Simulation of these cells shows that their operation has a very high SEU tolerance, the charges in the nodes of the circuits for non-volatile storage and gate leakage current reduction have very high values, thus ensuring that a SEU will highly unlike affect the correct functions. A SER analysis of these cells is also pursued. An extensive evaluation and comparison of different schemes are presented.