DocumentCode
159464
Title
Exploiting dynamic partial reconfiguration for on-line on-demand testing of permanent faults in reconfigurable systems
Author
Sorrenti, Domenico ; Cozzi, Dario ; Korf, Sebastian ; Cassano, Luca ; Hagemeyer, Jens ; Porrmann, Mario ; Bernardeschi, Cinzia
Author_Institution
Dept. of Inf. Eng., Univ. of Pisa, Pisa, Italy
fYear
2014
fDate
1-3 Oct. 2014
Firstpage
203
Lastpage
208
Abstract
Reconfigurable systems are increasingly employed in many application fields, including aerospace. The long term exposure to radiation of space electronics can cause permanent faults, that may lead to the failure of the mission. In this paper we present a novel technique for on-line on-demand testing of permanent faults in the routing structure of SRAM-based FPGAs, that are employed in reconfigurable systems. The basic idea is to place testing circuits on the resources of the FPGA which are unused at the moment to test them before using those resources when a functional module of the reconfigurable system has to be placed. The proposed technique has been implemented and the achieved fault coverage has been assessed on a real-world reconfigurable system. This experiment demonstrated that all the faults in the routing resources under test can be detected.
Keywords
SRAM chips; fault diagnosis; field programmable gate arrays; logic testing; FPGA; SRAM; dynamic partial reconfiguration; online on demand testing; permanent faults; reconfigurable systems; space electronics; testing circuits; Circuit faults; Clocks; Field programmable gate arrays; Radiation detectors; Routing; Testing; Wires; Aerospace; Dynamic Partial Reconfiguration; On-Demand Testing; On-Line Testing; Permanent Faults; Reconfigurable Systems; SRAM-based FPGAs; Satellite;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location
Amsterdam
Print_ISBN
978-1-4799-6154-2
Type
conf
DOI
10.1109/DFT.2014.6962065
Filename
6962065
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