• DocumentCode
    159471
  • Title

    Diagnostic self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults

  • Author

    Scholzel, Mario ; Koal, Tobias ; Vierhaus, Heinrich T.

  • Author_Institution
    Brandenburg Univ. of Technol., Cottbus, Germany
  • fYear
    2014
  • fDate
    1-3 Oct. 2014
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    Diagnostic self-test in-the-field for processors becomes mandatory for reconfigurable fault tolerant processor-based systems. Software-based self-test techniques are well suited for providing a pass/fail test in-the-field. However, a diagnostic result for dynamically scheduled processors is usually not obtained by these tests, because the software has no control about the used components of the processor during the execution of the test program. This paper provides a concept for a simple hardware extension of a dynamically scheduled processor, such that the test program gets control about the resource usage. With this technique, for the first time, it becomes feasible to perform a diagnostic software-based self-test for dynamically scheduled processors that is able to distinguish between faults in various components of the processor. In particular, the instruction queue, reservation stations, functional units, and reorder buffer are taken into account. Thereby, the hardware overhead for self-test and reconfiguration is less than 6%.
  • Keywords
    automatic testing; fault tolerant computing; reconfigurable architectures; diagnostic self-test; dynamically scheduled superscalar processors; functional units; instruction queue; permanent faults; reconfigurable fault tolerant processor-based systems; reconfiguration techniques; reorder buffer; reservation stations; software-based self-test techniques; Built-in self-test; Computer architecture; Fault tolerance; Fault tolerant systems; Hardware; Program processors; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4799-6154-2
  • Type

    conf

  • DOI
    10.1109/DFT.2014.6962072
  • Filename
    6962072