DocumentCode :
1594786
Title :
Image registration based on Mexican-hat wavelets and pseudo-Zernike moments
Author :
Nannan, Ding ; Yanying, Liu
Author_Institution :
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033, China
fYear :
2012
Firstpage :
1
Lastpage :
4
Abstract :
Image registration is a key technique in pattern recognition and image processing, and it is widely used in many application areas such as computer vision, remote sensing, image fusion and object tracking. A method for image registration combining Mexican-hat wavelets and pseudo-Zernike moments is proposed. Firstly, feature points are extracted using scale-interaction Mexican-hat wavelets in the reference image and sensed image respectively. Then, pseudo-Zernike moments are used to match them and classical RANSAC used to eliminate the wrong matches. And then, the well match points are used to estimate the best affine transform parameters by least squares minimization. At last, the sensed image is transformed and resampled to accomplish the image registration. The experiments indicate that the proposed algorithm extracts feature points and matches them exactly and eliminates wrong matched points effectively and achieves nice registration results.
Keywords :
Mexican-hat wavelets; RANSAC; bidirectional match; image registration; pseudo-Zernike Moments;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
World Automation Congress (WAC), 2012
Conference_Location :
Puerto Vallarta, Mexico
ISSN :
2154-4824
Print_ISBN :
978-1-4673-4497-5
Type :
conf
Filename :
6321846
Link To Document :
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