DocumentCode
159489
Title
On the in-field functional testing of decode units in pipelined RISC processors
Author
Bernardi, P. ; Cantoro, R. ; Ciganda, L. ; Sanchez, E. ; Reorda, M. Sonza ; de Luca, Stefano ; Meregalli, R. ; Sansonetti, A.
Author_Institution
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
fYear
2014
fDate
1-3 Oct. 2014
Firstpage
299
Lastpage
304
Abstract
The paper is dealing with the in-field test of the decode unit of RISC processors through functional test programs following the SBST approach. The paper details a strategy based on instruction classification and manipulation, and signatures collection. The method does not require the knowledge of detailed implementation information (e.g., the netlist), but is based on the Instruction Set of the processor. The proposed method is evaluated on an industrial SoC device, which includes a PowerPC derived processor. Results demonstrate the efficiency and effectiveness of the strategy; the proposed solution reaches over 90% of stuck-at fault coverage while an instruction coverage based approach does not overcome 70%.
Keywords
fault diagnosis; logic testing; microprocessor chips; reduced instruction set computing; system-on-chip; PowerPC derived processor; SBST approach; decode units; functional test programs; in-field functional testing; industrial SoC device; instruction classification; instruction manipulation; pipelined RISC processors; signatures collection; stuck-at fault coverage; Encoding; Law; Reduced instruction set computing; Registers; Testing; Software-Based Self-Test programs; decode unit; fault grading; instruction coverage;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location
Amsterdam
Print_ISBN
978-1-4799-6154-2
Type
conf
DOI
10.1109/DFT.2014.6962090
Filename
6962090
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