• DocumentCode
    1594937
  • Title

    The adaptation of test-driven software processes to industrial automation engineering

  • Author

    Hametner, Reinhard ; Winkler, Dietmar ; Östreicher, Thomas ; Biffl, Stefan ; Zoitl, Alois

  • Author_Institution
    Autom. & Control Inst., Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2010
  • Firstpage
    921
  • Lastpage
    927
  • Abstract
    Software components provide an increasing part of added value in automation systems and become more complex to construct and test. Test-driven development (TDD) of software systems has been successfully used for agile development of business software systems. Test cases guide the system implementation and can be executed automatically after software changes (continuous integration & build strategy). However, TDD processes need to be adapted to control automation systems engineering, where real-world systems are challenging to model and to test automatically. In this paper we introduce an adapted TDD process from the business software engineering domain to industrial automation engineering. We identify a set of UML models that enable the systematic derivation of test cases. Based on an initial empirical study we evaluate the adapted TDD process based on an industrial use case to identify strength and limitation of this approach. Major results of the study were that UML models enabled effective test case derivation in the study context.
  • Keywords
    Unified Modeling Language; production engineering computing; program testing; software engineering; TDD process; UML models; automation systems engineering; business software engineering; industrial automation engineering; software component; test case; test driven software process; Automatic control; Automatic testing; Automation; Computer industry; Control system synthesis; Software systems; Software testing; System testing; Systems engineering and theory; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Informatics (INDIN), 2010 8th IEEE International Conference on
  • Conference_Location
    Osaka
  • Print_ISBN
    978-1-4244-7298-7
  • Type

    conf

  • DOI
    10.1109/INDIN.2010.5549620
  • Filename
    5549620