DocumentCode :
159497
Title :
Reusing the IEEE 1500 design for test infrastructure for security monitoring of Systems-on-Chip
Author :
Backer, Jerry ; Hely, D. ; Karri, Ramesh
Author_Institution :
Polytech. Sch. of Eng., New York Univ., New York, NY, USA
fYear :
2014
fDate :
1-3 Oct. 2014
Firstpage :
52
Lastpage :
56
Abstract :
Systems-on-chip (SoCs) are vulnerable to attacks by malicious software and hardware trojans. This work explores if the Design for Test (DfT) infrastructure in SoCs can tackle these security threats with minimum hardware overhead. We show that the observability and plug-and-play features of the IEEE 1500 DfT can be used for scalable security monitoring in SoCs. Existing SoC security countermeasures can reuse the DfT-based security architecture to detect software and hardware attacks. The proposed DfT reuse imposes negligible hardware and performance overheads and doesn´t require modifications to the SoC.
Keywords :
design for testability; invasive software; system-on-chip; DfT infrastructure; IEEE 1500 DfT; SoC; design for test infrastructure; hardware overhead; hardware trojans; malicious software; observability features; plug-and-play features; security monitoring; security threats; systems-on-chip; Engines; Hardware; IP networks; Monitoring; Pins; Security; System-on-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4799-6154-2
Type :
conf
DOI :
10.1109/DFT.2014.6962098
Filename :
6962098
Link To Document :
بازگشت