Title :
Diagnosis of segment delay defects with current sensing
Author :
Aljubouri, Wisam ; Somashekar, Ahish Mysore ; Haniotakis, Themistoklis ; Tragoudas, Spyros
Author_Institution :
ECE Dept., Southern Illinois Univ., Carbondale, IL, USA
Abstract :
A novel technique based on the current profile of path segments is presented. Certain current profiles can provide significant insights into the delay characteristics of the segments. They can assist in post-silicon diagnosis for delay defects and also determine shifts in the values of process parameters along the segments. A method to excite such current profiles is presented. Experimental evaluation on benchmark circuits shows the effectiveness of the approach.
Keywords :
delay circuits; electric sensing devices; elemental semiconductors; silicon; Si; benchmark circuits; current profile; current sensing; delay characteristics; path segments; post-silicon diagnosis; process parameters; segment delay defect diagnosis; Current measurement; Delays; Integrated circuit modeling; Layout; Logic gates; Sensor systems;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4799-6154-2
DOI :
10.1109/DFT.2014.6962101
