DocumentCode
159502
Title
Improved correction for hot pixels in digital imagers
Author
Chapman, Glenn H. ; Thomas, Robert ; Thomas, Robert ; Koren, Israel ; Koren, Zahava
Author_Institution
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
fYear
2014
fDate
1-3 Oct. 2014
Firstpage
116
Lastpage
121
Abstract
From extensive study of digital imager defects, we found that “Hot Pixels” are the main digital camera defects, and that they increase at a nearly constant temporal rate over the camera´s lifetime. Previously we characterized the hot pixels by a linear function of the exposure time in response to a dark frame setting. Using a camera with 55 known hot pixels, we compared our hot pixel correction algorithm to a conventional 4-nearest neighbor interpolation techniques. We developed a new “moving camera” method to exactly obtain both the actual hot pixel contribution and the true undamaged pixel value at a defect. Using these calibrated results we find that the correction method should be based on the hot pixel severity, the illumination intensity at the pixel, camera parameters such as ISO and exposure time, and on the neighboring pixels´ variability.
Keywords
ISO standards; cameras; image enhancement; image sensors; interpolation; ISO; camera lifetime; camera parameters; correction method; digital imager defects; exposure time; hot pixel correction algorithm; hot pixel severity; illumination intensity; linear function; moving camera method; nearest neighbor interpolation techniques; neighboring pixels variability; Cameras; Digital images; ISO; Image color analysis; Interpolation; Lighting; Sensors; CCD; ISO; active pixel sensor APS; hot pixel; imager defect correction;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location
Amsterdam
Print_ISBN
978-1-4799-6154-2
Type
conf
DOI
10.1109/DFT.2014.6962103
Filename
6962103
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