Title :
Improved correction for hot pixels in digital imagers
Author :
Chapman, Glenn H. ; Thomas, Robert ; Thomas, Robert ; Koren, Israel ; Koren, Zahava
Author_Institution :
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Abstract :
From extensive study of digital imager defects, we found that “Hot Pixels” are the main digital camera defects, and that they increase at a nearly constant temporal rate over the camera´s lifetime. Previously we characterized the hot pixels by a linear function of the exposure time in response to a dark frame setting. Using a camera with 55 known hot pixels, we compared our hot pixel correction algorithm to a conventional 4-nearest neighbor interpolation techniques. We developed a new “moving camera” method to exactly obtain both the actual hot pixel contribution and the true undamaged pixel value at a defect. Using these calibrated results we find that the correction method should be based on the hot pixel severity, the illumination intensity at the pixel, camera parameters such as ISO and exposure time, and on the neighboring pixels´ variability.
Keywords :
ISO standards; cameras; image enhancement; image sensors; interpolation; ISO; camera lifetime; camera parameters; correction method; digital imager defects; exposure time; hot pixel correction algorithm; hot pixel severity; illumination intensity; linear function; moving camera method; nearest neighbor interpolation techniques; neighboring pixels variability; Cameras; Digital images; ISO; Image color analysis; Interpolation; Lighting; Sensors; CCD; ISO; active pixel sensor APS; hot pixel; imager defect correction;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4799-6154-2
DOI :
10.1109/DFT.2014.6962103