DocumentCode :
1595331
Title :
GPS Methods for 3-D Surface Profile Measurement on Light Scattering Surfaces
Author :
Kim, ByoungChang ; Kim, SeHeon ; Kwon, YongKwan
Author_Institution :
Sch. of Mech. & Autom. Eng., Kyungnam Univ., Masan
fYear :
2006
Firstpage :
2911
Lastpage :
2914
Abstract :
In this paper, it is proposed that GPS (Global Positioning System) methods are used for 3-D surface profile measurement of light scattering surface. This method is a new way that use the diffraction interference diverged from multiple two-point-diffraction sources made of a pair of single-mode fiber
Keywords :
Global Positioning System; fibre optic sensors; light interferometry; light scattering; light sources; rough surfaces; surface topography measurement; 3-D surface profile measurement; GPS method; diffraction interferometer system; global positioning system; light scattering rough surfaces; multiple two-point-diffraction sources; single-mode fiber; Global Positioning System; Light scattering; Optical diffraction; Optical fiber couplers; Optical fibers; Optical interferometry; Optical surface waves; Rough surfaces; Surface emitting lasers; Surface roughness; 3-D profilometry; GPS; Point-diffraction interferometer; multilateration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SICE-ICASE, 2006. International Joint Conference
Conference_Location :
Busan
Print_ISBN :
89-950038-4-7
Electronic_ISBN :
89-950038-5-5
Type :
conf
DOI :
10.1109/SICE.2006.314910
Filename :
4108143
Link To Document :
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