DocumentCode :
1595368
Title :
Locally Testing Direct Product in the Low Error Range
Author :
Dinur, Irit ; Goldenberg, Elazar
Author_Institution :
Dept. of Appl. Math & CS, Weizmann Inst.
fYear :
2008
Firstpage :
613
Lastpage :
622
Abstract :
Given a function f : X rarr Sigma, its lscr-wise direct product is the function F = flscr : Xlscr rarr Sigmalscr defined by: F(x1,...,xlscr) = (f(x1),...,f(xlscr)). We are interested in the local testability of the direct product encoding (mapping f rarr flscr). Namely, given an arbitrary function F : Xlscr rarr Sigmalscr, we wish to determine how close it is to flscr for some f : X rarr Sigma, by making two random queries into F. In this work we analyze the case of low acceptance probability of the test. We show that even if the test passes with small probability, epsiv>0, already F must have a non-trivial structure and in particular must agree with some flscr on nearly epsiv of the domain. Moreover, we give a structural characterization of all functions F on which the test passes with probability epsiv. Our results can be viewed as a combinatorial analog of the low error dasialow degree testpsila, that is used in PCP constructions.
Keywords :
encoding; probability; PCP constructions; combinatorial analog; direct product encoding; local direct product testing; random queries; Computer errors; Computer science; Encoding; Testing; direct product; list decoding; low error; property testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Foundations of Computer Science, 2008. FOCS '08. IEEE 49th Annual IEEE Symposium on
Conference_Location :
Philadelphia, PA
ISSN :
0272-5428
Print_ISBN :
978-0-7695-3436-7
Type :
conf
DOI :
10.1109/FOCS.2008.26
Filename :
4690994
Link To Document :
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