• DocumentCode
    1595368
  • Title

    Locally Testing Direct Product in the Low Error Range

  • Author

    Dinur, Irit ; Goldenberg, Elazar

  • Author_Institution
    Dept. of Appl. Math & CS, Weizmann Inst.
  • fYear
    2008
  • Firstpage
    613
  • Lastpage
    622
  • Abstract
    Given a function f : X rarr Sigma, its lscr-wise direct product is the function F = flscr : Xlscr rarr Sigmalscr defined by: F(x1,...,xlscr) = (f(x1),...,f(xlscr)). We are interested in the local testability of the direct product encoding (mapping f rarr flscr). Namely, given an arbitrary function F : Xlscr rarr Sigmalscr, we wish to determine how close it is to flscr for some f : X rarr Sigma, by making two random queries into F. In this work we analyze the case of low acceptance probability of the test. We show that even if the test passes with small probability, epsiv>0, already F must have a non-trivial structure and in particular must agree with some flscr on nearly epsiv of the domain. Moreover, we give a structural characterization of all functions F on which the test passes with probability epsiv. Our results can be viewed as a combinatorial analog of the low error dasialow degree testpsila, that is used in PCP constructions.
  • Keywords
    encoding; probability; PCP constructions; combinatorial analog; direct product encoding; local direct product testing; random queries; Computer errors; Computer science; Encoding; Testing; direct product; list decoding; low error; property testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Foundations of Computer Science, 2008. FOCS '08. IEEE 49th Annual IEEE Symposium on
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0272-5428
  • Print_ISBN
    978-0-7695-3436-7
  • Type

    conf

  • DOI
    10.1109/FOCS.2008.26
  • Filename
    4690994