DocumentCode
1595368
Title
Locally Testing Direct Product in the Low Error Range
Author
Dinur, Irit ; Goldenberg, Elazar
Author_Institution
Dept. of Appl. Math & CS, Weizmann Inst.
fYear
2008
Firstpage
613
Lastpage
622
Abstract
Given a function f : X rarr Sigma, its lscr-wise direct product is the function F = flscr : Xlscr rarr Sigmalscr defined by: F(x1,...,xlscr) = (f(x1),...,f(xlscr)). We are interested in the local testability of the direct product encoding (mapping f rarr flscr). Namely, given an arbitrary function F : Xlscr rarr Sigmalscr, we wish to determine how close it is to flscr for some f : X rarr Sigma, by making two random queries into F. In this work we analyze the case of low acceptance probability of the test. We show that even if the test passes with small probability, epsiv>0, already F must have a non-trivial structure and in particular must agree with some flscr on nearly epsiv of the domain. Moreover, we give a structural characterization of all functions F on which the test passes with probability epsiv. Our results can be viewed as a combinatorial analog of the low error dasialow degree testpsila, that is used in PCP constructions.
Keywords
encoding; probability; PCP constructions; combinatorial analog; direct product encoding; local direct product testing; random queries; Computer errors; Computer science; Encoding; Testing; direct product; list decoding; low error; property testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Foundations of Computer Science, 2008. FOCS '08. IEEE 49th Annual IEEE Symposium on
Conference_Location
Philadelphia, PA
ISSN
0272-5428
Print_ISBN
978-0-7695-3436-7
Type
conf
DOI
10.1109/FOCS.2008.26
Filename
4690994
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