Title :
Characterization of integrated semiconductor optical amplifiers in the JePPIX multi-project wafer platform
Author_Institution :
Aeon Corp., 186 Princeton-Hightstown Rd, Bldg 4A, Princeton Junction, NJ 08550, U.S.A.
Abstract :
Several research institutes and commercial foundries presently offer shared wafer processing services based on generic integration technology. We have characterized SOAs fabricated in such a platform and compare their performance to discrete devices fabricated in a dedicated commercial process. Despite some limitations (presently single polarization and only C-band available), the characteristics of the integrated SOAs come quite close to their discrete counterparts.
Keywords :
Photonic integrated circuit; semiconductor optical amplifier;
Conference_Titel :
Transparent Optical Networks (ICTON), 2015 17th International Conference on
Conference_Location :
Budapest, Hungary
DOI :
10.1109/ICTON.2015.7193699
