Title :
A VHSIC compatible CMOS/SOS cell family
Author :
Martinez, M.A. ; Polkinghorn, R.W.
Author_Institution :
Rockwell Microelecton. Res. & Dev. Center, Newport Beach, CA, USA
Abstract :
Summary form only given, as follows. The authors report on a family of standard cells and macro/compilers designed into a VHSIC-compatible, radiation-hard CMOS/SOS (silicon-on-sapphire) process. The family currently consists of one hundred standard cells and five macro/compilers. Standard cells include basic gate and flip-flop functions. The macro/compilers are available for RAMs, ROMs, multipliers, register files, and barrel shifters. A front-end design library is available for these functions on Daisy workstations to permit schematic capture, logic simulation, timing analysis, and netlist generation. Automatic placement and route is accomplished using VLSI Technology Inc. software on Apollo workstations. Compiled functions use VLSI technology compiler software. Back annotation to the Daisy permits resimulation using exact routing capacitances
Keywords :
CMOS integrated circuits; VLSI; circuit analysis computing; circuit layout CAD; digital integrated circuits; integrated circuit technology; integrated logic circuits; integrated memory circuits; logic CAD; radiation hardening (electronics); Apollo workstations; CAD; CMOS/SOS cell family; Daisy workstations; RAMs; ROMs; Si-Al2O3; VHSIC compatible; VLSI technology compiler software; automatic placement/route; barrel shifters; computer aided design; digital IC; exact routing capacitances; flip-flop functions; front-end design library; gate functions; layout; logic design; logic simulation; macro/compilers; multipliers; netlist generation; radiation hard process; register files; resimulation; schematic capture; standard cells; timing analysis; Analytical models; CMOS process; Flip-flops; Logic design; Read only memory; Software libraries; Timing; Very high speed integrated circuits; Very large scale integration; Workstations;
Conference_Titel :
SOS/SOI Technology Workshop, 1988. Proceedings., 1988 IEEE
Conference_Location :
St. Simons Island, GA
DOI :
10.1109/SOI.1988.95441
