DocumentCode
1596196
Title
The uniformity and reliability of CdTe array radiation detectors
Author
Iwase, Y. ; Takamura, H. ; Urata, K. ; Ohmori, M.
Author_Institution
Nippon Min. Co. Ltd., Saitama, Japan
fYear
1991
Firstpage
840
Lastpage
843
Abstract
A 90-element CdTe array radiation detector was fabricated. An average energy resolution of 6.9 keV and a count rate variation for each detector of less than 11% for 60 keV gamma -rays were achieved. Time-dependent instability was obtained with a count rate drift of less than 1% within 1 h after bias application. It is believed that these detectors can be applied to sensors of X- and gamma -ray imaging. To achieve these characteristics, a large grain crystal, above 13 mm square in this case, with homogenous distribution of crystal defects, and a reproducible fabrication process and assembly technique, which were mainly accomplished by utilizing machine controlling, were applied. Temperature cycling, humidity cycling, thermal shock, hermetic seal, mechanical shock, vibration fatigue, natural fall, and low temperature storage tests indicated no major problems with the detector under normal conditions. The mean time to failure investigated by the high temperature operating test was estimated to be more than 1*10/sup 6/ h at room temperature.<>
Keywords
II-VI semiconductors; X-ray detection and measurement; cadmium compounds; environmental testing; gamma-ray detection and measurement; image sensors; semiconductor counters; 13 mm; 6.9 keV; 60 keV; CdTe array radiation detector; MTTF; X-ray imaging; count rate drift; crystal defects; gamma ray imaging; grain crystal; homogenous distribution; humidity cycling; image sensor; low temperature storage tests; mean time to failure; mechanical shock; natural fall; reliability; reproducible fabrication; temperature cycling; thermal shock; uniformity; vibration fatigue; Electric shock; Energy resolution; Gamma ray detection; Gamma ray detectors; Image sensors; Radiation detectors; Sensor arrays; Sensor phenomena and characterization; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-87942-585-7
Type
conf
DOI
10.1109/SENSOR.1991.149015
Filename
149015
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