Title :
Effect of the geometry on the aging of metalized polypropylene film capacitors
Author :
El-Husseini, M.H. ; Venet, P. ; Rojat, G. ; Fathallah, M.
Author_Institution :
CEGELY-UCBL, UMR-CNRS, Villeurbanne, France
fDate :
6/23/1905 12:00:00 AM
Abstract :
Aging of MPPF capacitors have been studied in this paper with the aim to improve their reliability regarding their design. The statistical approach showed that the failure mode may be represented by two parameter Weibull distribution and the experimental approach proved that a long capacitor deteriorates faster than a plate-shaped capacitor having the same features
Keywords :
Weibull distribution; ageing; capacitors; metallisation; polymer films; statistical analysis; thin film capacitors; aging; failure mode; geometry effect; long capacitor; metalized polypropylene film capacitors; plate-shaped capacitor; reliability improvement; self-healing mechanism; statistical approach; two parameter Weibull distribution; Aging; Capacitors; Failure analysis; Geometry; Manufacturing; Optical films; Power system reliability; Power system security; Stress; Testing;
Conference_Titel :
Power Electronics Specialists Conference, 2001. PESC. 2001 IEEE 32nd Annual
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7067-8
DOI :
10.1109/PESC.2001.954424
