DocumentCode :
15965
Title :
3-D Internal Charging Simulation on Typical Printed Circuit Board
Author :
Xiao-Jin Tang ; Zhong Yi ; Li-Fei Meng ; Ye-Nan Liu ; Chao Zhang ; Jian-Guo Huang ; Zhi-Hao Wang
Author_Institution :
Sci. & Technol. on Reliability & Environ. Eng. Lab., Beijing Inst. of Spacecraft Environ. Eng., Beijing, China
Volume :
41
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
3448
Lastpage :
3452
Abstract :
To obtain more accurate results of internal charging effects, a 3-D computation method of internal charging electric field and potential for arbitrary configuration is developed. In this paper, the charging of a typical printed circuit board partially grounded, which is immersed in high energetic electrons, is simulated to illustrate the 3-D method. It includes two steps: 3-D electron transport simulation and internal electric field calculation. The electron transport is simulated using a self-developed software found on GEANT4. The 3-D calculation of internal electric field at charging equilibrium is conducted by solving a set of electrostatic equations by the software COMSOL Multiphysics. On the basis of the above-said method, the 3-D field and potential distributions within the board are obtained. For the purpose of comparison, a simpler 1-D planar dielectric grounded at the back surface is simulated in the same method. From the simulation results, the following conclusions are drawn: grounding has significant influence on electric field distribution, and the maximum field generally occurs at grounding edges or corners. The electric field computed by the 3-D algorithm is much larger than the 1-D simplified method widely used at present and, hence, the 1-D method may neglect crucial risk.
Keywords :
electric fields; electronic engineering computing; electrons; printed circuits; 3D electron transport simulation; 3D internal charging simulation; COMSOL multiphysics; GEANT4; electrostatic equations; high energetic electrons; internal charging electric field; printed circuit board; Computational modeling; Dielectrics; Equations; Grounding; Integrated circuit modeling; Mathematical model; Solid modeling; 3-D simulation; Monte Carlo method; internal charging; internal electric field;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2013.2268580
Filename :
6549190
Link To Document :
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