Title :
Metrological aspects of the multiparameter measurement processing function identification
Author :
Hachol, A. ; Juniewicz, Henryk M. ; Kedryna, Zbigniew M.
Author_Institution :
Inst. of Electr. Metrol., Wroclaw Tech. Univ., Poland
Abstract :
A description is given of multiparameter measurement and multiparameter sensor concepts. The X quantities measured at the sensor output are related to its input quantities consisting of the measurand W and the influence quantities Z. The multiparameter measurement elaboration algorithm is presented, in which the multiparameter measurement processing function (MMPF) determination method and the metrological analysis of that matching quality to experimental data are discussed. Two basic types of error are distinguished: processing function approximation error and the error resulting from the influence of quantity variability. The metrological criteria of MMPF selection are formulated
Keywords :
detectors; identification; measurement theory; signal processing; X quantities; error; matching quality; metrological analysis; multiparameter measurement processing function identification; multiparameter sensor; quantity variability; Algorithm design and analysis; Capacitance measurement; Capacitive sensors; Conducting materials; Electric variables measurement; Frequency measurement; Impedance measurement; Instruments; Metrology; Sensor phenomena and characterization;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
DOI :
10.1109/IMTC.1991.161626
