• DocumentCode
    1596754
  • Title

    Characterization of paralleled super junction MOSFET devices under hardand soft-switching conditions

  • Author

    Huang, Xudong ; Yu, Huijie ; Lai, Jih-Sheng ; Hefner, A.R. ; Berning, D.W.

  • Author_Institution
    Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    4
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    2145
  • Abstract
    The super junction (SJ) MOSFET exhibits conduction and switching properties similar to those of conventional power MOSFETs. In this paper, we investigate possible benefits and problems associated with connecting SJ MOSFET in parallel for high-power applications. Measured circuit performances of paralleled SJ MOSFET devices are evaluated under hard- and soft-switching conditions. The measurements include (1) turn-on and turn-off switching voltage and current comparison, (2) gate driver resistance effects on current sharing between paralleled SJ MOSFET devices, and (3) SJ MOSFET body diode behavior under hard- and soft-switching conditions. Two test circuits are developed for paralleled SJ MOSFET evaluation. One is an auxiliary resonant snubber chopper for the near zero-voltage switching test, and the other one is an auxiliary resonant snubber inverter for the true zero-voltage condition test. Experimental results indicate that SJ MOSFET can be paralleled without the need for precise device matching if the gate drive resistances are closely matched
  • Keywords
    choppers (circuits); driver circuits; electric resistance; invertors; power MOSFET; resonant power convertors; snubbers; auxiliary resonant snubber chopper; auxiliary resonant snubber inverter; body diode behavior; circuit performances measurement; conduction properties; current sharing; gate driver resistance effects; hard-switching conditions; paralleled super junction MOSFET devices; soft-switching conditions; switching properties; test circuits; turn-off switching current; turn-off switching voltage; turn-on switching current; turn-on switching voltage; zero-voltage condition test; zero-voltage switching test; Circuit testing; Current measurement; Electrical resistance measurement; Joining processes; MOSFET circuits; Performance evaluation; Power MOSFET; Resonance; Snubbers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2001. PESC. 2001 IEEE 32nd Annual
  • Conference_Location
    Vancouver, BC
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-7067-8
  • Type

    conf

  • DOI
    10.1109/PESC.2001.954437
  • Filename
    954437