Title :
SOI thin film fully depleted high performance devices
Author_Institution :
Northern Telecom Electron. Ltd., Ottawa, Ont., Canada
Abstract :
Summary form only given. SOI devices fall into two categories: thick-film partially depleted (PD) MOSFETs and thin-film fully depleted (FD) MOSFETs. The basic operation differences between PD and FD MOSFETs have been explored with the aid of two-dimensional numerical modeling. It is found from both modeling and experimental data that FD MOSFETs offer a significant reduction in the two-dimensional short-channel effects and the kink effect found in the PD MOSFETs. The salient design features of the FD MOSFETs are described. CMOS MOSFETs fabricated with gate lengths as short as 400 nm exhibit very good saturation characteristics with electron mobilities of approximately 550 cm2 /V-s. Ring oscillators with gate lengths of 1.2 μm have shown inverter stage delays of 65 ps. These ring oscillators also show very well-behaved capacitive coupling to the underlying bulk substrate
Keywords :
CMOS integrated circuits; insulated gate field effect transistors; semiconductor device models; thin film transistors; 1.2 micron; 65 ps; CMOS; MOSFETs; SOI; Si; TFT; capacitive coupling; electron mobilities; gate lengths; inverter stage delays; kink effect; monolithic IC; ring oscillators; saturation characteristics; short-channel effects; thin film fully depleted devices; two-dimensional numerical modeling; Electrodes; Fabrication; MOSFETs; Numerical models; Ring oscillators; Silicon on insulator technology; Telecommunications; Thick films; Thin film circuits; Thin film devices;
Conference_Titel :
SOS/SOI Technology Workshop, 1988. Proceedings., 1988 IEEE
Conference_Location :
St. Simons Island, GA
DOI :
10.1109/SOI.1988.95445