Simulations of microchannel plate sensitivity to <20 keV x-rays as a function of energy and incident angle

Author

Kruschwitz, Craig A. ; Ming Wu ; Rochau, Greg

Author_Institution

Los Alamos Oper., Nat. Security Technol., LLC, Los Alamos, NM, USA

fYear

2013

Firstpage

1

Lastpage

1

Abstract

We present results of Monte Carlo simulations of microchannel plate (MCP) response to x-rays in the 250 eV to 20 keV energy range as a function of both x-ray energy and impact angle. The model is based on the model presented in Rochau et al. However, while the Rochau et al. model was two-dimensional, and their results only went to 5 keV, our results have been expanded to 20 keV, and our model has been incorporated into a three-dimensional Monte Carlo MCP model that we have developed over the past several years. X-ray penetration through multiple MCP pore walls is increasingly important above 5 keV. The effect of x-ray penetration through multiple pores on MCP performance was studied and is presented.

Keywords

Monte Carlo methods; X-ray applications; microchannel plates; position sensitive particle detectors; MCP performance; MCP response; Monte Carlo simulations; X-ray energy angle; X-ray impact angle; X-ray penetration effect; X-rays; energy angle function; energy range; incident angle function; microchannel plate response; microchannel plate sensitivity simulations; multiple MCP pore walls; three-dimensional MCP model; three-dimensional Monte Carlo model; two-dimensional model; Detectors; Microchannel; Monte Carlo methods; National security; Sensitivity; Solid modeling; X-rays;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on

Conference_Location

San Francisco, CA

ISSN

0730-9244

Type

conf

DOI

10.1109/PLASMA.2013.6635022

Filename

6635022