DocumentCode :
1597274
Title :
X-ray pinhole camera measurements
Author :
Nelson, Daniel S. ; Berninger, Michael J. ; Flores, Paul A. ; Good, Douglas E. ; Henderson, D.J. ; Hogge, Keith W. ; Huber, Stephen R. ; Lutz, Stephen S. ; Mitchell, Stephen E. ; Howe, Russell A. ; Mitton, Charles V. ; Molina, Inigo ; Bozman, Dan R. ; Cor
Author_Institution :
Nat. Security Technol., LLC, Las Vegas, NV, USA
fYear :
2013
Firstpage :
1
Lastpage :
1
Abstract :
The development of the rod pinch diode has lead to high resolution radiography used on contained explosive experiments. The rod pinch diodes use a small diameter anode rod, which extends through a cathode aperture. Electrons borne off the aperture edge can self-insulate and pinch onto the tip of the rod, creating an intense, small x-ray source. This source is utilized as the primary diagnostic on numerous experiments that include high-value, single-shot events. In such applications there is an emphasis on machine reliability, x-ray reproducibility, and x-ray quality. We have observed that an additional pinch occurs at the interface near the anode rod and the rod holder. This suggests that there are stray electrons emitted from the surfaces of the surrounding area. In this paper we present results of x-ray measurements using a pinhole camera. The camera geometry used is an upstream view 30° with respect to the diode centerline. This diagnostic will be employed to: (1) diagnose x-ray reproducibility and quality, and (2) investigate the effect of different diode configurations.
Keywords :
X-ray apparatus; X-ray production; anodes; cameras; radiography; reliability; X-ray measurements; X-ray pinhole camera measurements; X-ray quality; X-ray reproducibility; aperture edge; camera geometry; cathode aperture; diode centerline; diode configurations; explosive experiments; high resolution radiography; high-value single-shot events; intense small X-ray source; machine reliability; pinhole camera; primary diagnostic; rod holder; rod pinch diode; small diameter anode rod; stray electrons; upstream view; Abstracts; Anodes; Apertures; Cameras; Laboratories; National security; Radiography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location :
San Francisco, CA
ISSN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2013.6635028
Filename :
6635028
Link To Document :
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