DocumentCode :
159731
Title :
Improving the Recognition Performance of NIALM Algorithms through Technical Labeling
Author :
Mathis, Marcel ; Rumsch, Andreas ; Kistler, Rolf ; Andrushevich, Aliaksei ; Klapproth, Alexander
Author_Institution :
CEESAR-iHomeLab, Univ. of Appl. Sci. & Arts, Horw, Switzerland
fYear :
2014
fDate :
26-28 Aug. 2014
Firstpage :
227
Lastpage :
233
Abstract :
A myriad of different electrical devices populate a typical household nowadays. Non-intrusive appliance load monitoring (NIALM) is an approach to find out how much energy each of them consumes in order to take measures to improve the overall energy efficiency. This article describes the ongoing research on improving electric loads recognition performed by NIALM algorithms within the context of smart homes and intelligent environments. The recognition performance can be significantly improved by decreasing the number of categories to be analyzed. The authors studied several labeling methods to categorize and group loads in order to increase the overall recognition rate. 31 different devices have been measured and labeled in different device states. Their input curves have been compared with 5 different machine learning algorithms. The best results could be reached by dividing all the loads into groups with small divergence in their normalized current curve. This approach has significantly increased the performance of NIALM recognition algorithms.
Keywords :
domestic appliances; energy conservation; learning (artificial intelligence); load (electric); power aware computing; NIALM recognition algorithm performance; electric load recognition; electrical devices; energy efficiency; input curves; machine learning algorithms; nonintrusive appliance load monitoring; normalized current curve; overall recognition rate; smart homes; technical labeling; Accuracy; Current measurement; Labeling; Machine learning algorithms; Object recognition; Performance evaluation; Wavelet transforms; Fourier Transformation; NIALM; NILM; Wavelet; device categorisation; device labeling; intelligent environment; load disaggregation; load recognition; machine learning algorithm; technical labeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Embedded and Ubiquitous Computing (EUC), 2014 12th IEEE International Conference on
Conference_Location :
Milano
Type :
conf
DOI :
10.1109/EUC.2014.41
Filename :
6962291
Link To Document :
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