Title :
Comparison of partial discharge measurement and simulation results for spherical cavities within solid dielectric materials as a function of frequency using Finite Element Analysis method
Author :
Illias, H.A. ; Chen, G. ; Lewin, P.L.
Author_Institution :
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
Abstract :
Partial discharge (PD) is a discharge phenomenon that does not bridge the whole electrodes within a dielectric insulation under high field stress. The measurement of PD activity is used in the insulation diagnosis of high voltage components. A better understanding of PD may be gained from modeling of the discharge process. This paper is an extension from previous works by the same authors which have considered the modeling of PD activity in a spherical cavity within a dielectric material by using Finite Element Analysis (FEA) method to study the influence of applied frequency. However, in this paper, simulation results are compared with measurement results as a function of frequency. From this, the parameters that influence PD frequency dependent behavior have been identified through comparison between experimental measurement and simulation results.
Keywords :
dielectric materials; finite element analysis; insulation; partial discharge measurement; PD activity measurement; PD frequency dependent behavior; discharge process modelling; electrodes; finite element analysis method; frequency function; high field stress; high voltage component insulation diagnosis; partial discharge measurement; solid dielectric materials; spherical cavity simulation; Analytical models; Bridge circuits; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Finite element methods; Frequency measurement; Partial discharge measurement; Partial discharges; Solid modeling; Partial discharge; component; finite element analysis method; spherical cavity; variable frequency;
Conference_Titel :
Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-6298-8
DOI :
10.1109/ELINSL.2010.5549733