DocumentCode
1598040
Title
Algorithm, architecture, and implementation of algorithmic delay-locked loop based data recovery circuit for high-speed serial data communication
Author
Song, Hongjiang
Author_Institution
Intel Corp., Chandler, AZ, USA
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
83
Lastpage
87
Abstract
An algorithmic delay-locked loop (DLL) based high-speed serial data recovery circuit (DRC) architecture is proposed. This scheme is based on a novel modulator-based phase synthesis and phase error compensation principle, which offers advantages of inherently instantaneous locking capability, high jitter tolerance, and unconditional loop stability. Its fully digital, highly regular, modular, and scaleable VLSI implementations is very suitable for the SoC solution to various high-speed, low power applications. The architecture has been implemented in test chips fabricated using a 0.25 μm standard CMOS process technology. It occupied the area around 300 μm × 150 μm, consumed less than 4 mW power. It demonstrated higher than 800 Mb/s data rate, and a better than 10-9 BER at 480 Mb/s rate and the best measured BER of better than 10-12 with a 215-1 pseudorandom data stream across a USB cable
Keywords
CMOS digital integrated circuits; VLSI; application specific integrated circuits; data communication equipment; delay lock loops; digital communication; error compensation; error statistics; jitter; low-power electronics; 0.25 micron; 4 mW; 480 to 800 Mbit/s; BER; DLL-based data recovery circuit; SoC solution; algorithmic delay-locked loop; bit error rate; fully digital modular implementations; high jitter tolerance; high-speed low power applications; high-speed serial data communication; high-speed serial data recovery circuit; instantaneous locking capability; modulator-based phase synthesis; phase error compensation; scaleable VLSI implementations; standard CMOS process technology; unconditional loop stability; Bit error rate; CMOS process; Circuit stability; Circuit synthesis; Delay; Error compensation; Jitter; Phase modulation; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC/SOC Conference, 2001. Proceedings. 14th Annual IEEE International
Conference_Location
Arlington, VA
Print_ISBN
0-7803-6741-3
Type
conf
DOI
10.1109/ASIC.2001.954677
Filename
954677
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