DocumentCode :
1598040
Title :
Algorithm, architecture, and implementation of algorithmic delay-locked loop based data recovery circuit for high-speed serial data communication
Author :
Song, Hongjiang
Author_Institution :
Intel Corp., Chandler, AZ, USA
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
83
Lastpage :
87
Abstract :
An algorithmic delay-locked loop (DLL) based high-speed serial data recovery circuit (DRC) architecture is proposed. This scheme is based on a novel modulator-based phase synthesis and phase error compensation principle, which offers advantages of inherently instantaneous locking capability, high jitter tolerance, and unconditional loop stability. Its fully digital, highly regular, modular, and scaleable VLSI implementations is very suitable for the SoC solution to various high-speed, low power applications. The architecture has been implemented in test chips fabricated using a 0.25 μm standard CMOS process technology. It occupied the area around 300 μm × 150 μm, consumed less than 4 mW power. It demonstrated higher than 800 Mb/s data rate, and a better than 10-9 BER at 480 Mb/s rate and the best measured BER of better than 10-12 with a 215-1 pseudorandom data stream across a USB cable
Keywords :
CMOS digital integrated circuits; VLSI; application specific integrated circuits; data communication equipment; delay lock loops; digital communication; error compensation; error statistics; jitter; low-power electronics; 0.25 micron; 4 mW; 480 to 800 Mbit/s; BER; DLL-based data recovery circuit; SoC solution; algorithmic delay-locked loop; bit error rate; fully digital modular implementations; high jitter tolerance; high-speed low power applications; high-speed serial data communication; high-speed serial data recovery circuit; instantaneous locking capability; modulator-based phase synthesis; phase error compensation; scaleable VLSI implementations; standard CMOS process technology; unconditional loop stability; Bit error rate; CMOS process; Circuit stability; Circuit synthesis; Delay; Error compensation; Jitter; Phase modulation; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC/SOC Conference, 2001. Proceedings. 14th Annual IEEE International
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-6741-3
Type :
conf
DOI :
10.1109/ASIC.2001.954677
Filename :
954677
Link To Document :
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