PPPS-2013: Design of a paraxial inverse Compton scattering diagnostic for an intense relativistic electron beam

An inverse Compton scattering diagnostic is currently being developed for a 60 ns, intense relativistic electron bunch with an energy of 19.8 MeV and nominal current of 1.7 kA. The principal purpose of this diagnostic is to provide a measurement of the 6-D phase space distribution of the electron beam in a single shot without disrupting its axial propagation. The electron beam is intercepted by a 450 mJ of green light, which is upscattered into the soft X-ray range by the relativistic electrons. The diverging, scattered photons are diffracted onto an X-ray framing camera by an X-ray crystal concentric to the beam pipe utilizing an elongated von Hamos geometry¹. The experimental configuration is presented, which includes the electron and photon interaction dynamics, crystal design, and the expected time resolved longitudinal and transverse distributions.