• DocumentCode
    1598993
  • Title

    Development of an ionising radiation detector based on quantum dots absorbed in porous glass

  • Author

    Baharin, R. ; Hobson, P.R. ; Leslie, D.E. ; Smith, D.R.

  • Author_Institution
    Centre for Sensors & Instrum., Brunel Univ., Uxbridge, UK
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this work, we report measured effects on the fluorescent emission spectra of commercially produced core-shell (CdSe/ZnS) quantum dots (QDs). We report the effects on the fluorescent emission spectra of commercially produced CdSe/ZnS QDs of 2.5 nm, 3.3 nm and 6.3 nm size in toluene, following exposure to ~1 MeV gamma irradiation in the range 0.1-110 Gy. We show that damage depends on the size of the QDs and that increasing the concentration of QDs in the toluene decreases the effect. Recent work on the production of a prototype 2D imaging dosimeter, by absorbing a solution of green emitting QD in toluene into a sample of porous “Vycor” glass, has shown that QDs absorbed in the Vycor fluoresce under several hours of continual illumination and that the system continues to show fluorescence for several days after the initial preparation. Initial results of experiments to dynamically image the Vycor during electron irradiation are presented as is progress on the development of a second prototype device for 2D radiation dosimetry.
  • Keywords
    II-VI semiconductors; cadmium compounds; dosimetry; fluorescence; glass; ionisation; particle detectors; porous semiconductors; semiconductor counters; semiconductor quantum dots; wide band gap semiconductors; zinc compounds; 2D imaging dosimeter; 2D radiation dosimetry; CdSe-ZnS; Vycor fluoresce; continual illumination; electron irradiation; fluorescent emission spectra; gamma irradiation; green emitting QD; porous Vycor glass; quantum dot; Educational institutions; Fluorescence; Glass; Imaging; Optical variables measurement; Production; Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
  • Conference_Location
    Birmingham
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4673-2198-3
  • Type

    conf

  • DOI
    10.1109/NANO.2012.6322009
  • Filename
    6322009