DocumentCode :
1599140
Title :
Effect of test parameters on dynamic resistance measurement results from on-load tap changers
Author :
Erbrink, J.J. ; Gulski, E. ; Smit, J.J. ; Leich, R. ; Seitz, P.P. ; Quak, B.
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
fYear :
2010
Firstpage :
1
Lastpage :
5
Abstract :
Static resistance measurements on power transformers give an indication about increased contact resistances of the OLTC. Increased contact resistances can also be measured by means of a dynamic resistance measurement (DRM). This paper elaborates on condition diagnosis of electrical contacts of in-tank high-speed resistor tap changers using DRM. DRM uses a low test current through the on-load tap changer to detect increased contact resistances and current interruptions. The difference with static resistance measurements is that the tap changer is switched through all its tap positions during the test. The test current gets no change to fully stabilize due to the inductance of the transformer windings. DRM is therefore less accurate then static resistance measurements but contains more information about the type and location of tap changer defect. This contribution will show that more defects on OLTC´s can be found with DRM compared to static resistance tests: the additional value of DRM compared to static winding resistance measurements is discussed. Secondly, important topics that should be considered when performing dynamic resistance measurements are discussed, like the effect of the test current amplitude, the secondary short-circuit and circuit resistance. Simulation results and experimental data are presented to make the reader familiar with the pros and cons of dynamic resistance measurements.
Keywords :
electric resistance measurement; electrical contacts; on load tap changers; power transformer testing; circuit resistance; condition diagnosis; contact resistance; dynamic resistance measurement; electrical contacts; in-tank high speed resistor tap changer; on load tap changers; secondary short circuit; test current amplitude; test parameter; Circuit simulation; Circuit testing; Contacts; Electrical resistance measurement; Inductance; On load tap changers; Performance evaluation; Power transformers; Resistors; Windings; aging; contact resistance; contacts; diagnostic expert systems; dynamic response; power transformers; resistance measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
Conference_Location :
San Diego, CA
ISSN :
1089-084X
Print_ISBN :
978-1-4244-6298-8
Type :
conf
DOI :
10.1109/ELINSL.2010.5549774
Filename :
5549774
Link To Document :
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