• DocumentCode
    1599170
  • Title

    Moisture determination and degradation of solid insulation system of power transformers

  • Author

    Sumereder, C. ; Muhr, M.

  • Author_Institution
    Inst. of High Voltage Eng. & Syst. Manage., Graz Univ. of Technol., Graz, Austria
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The reliability and operational risk of power transformers is strongly dependant on the condition of the electrical insulation system. Different kind of stress can be distinguished, normally a combination of electrical and thermal stress is present as well as the influence of humidity in the insulation system has to be considered. The so called multi-stress load results in an accelerated ageing process and the degradation of the insulation system. The condition of the mineral oil can be determined by sampling and analyzing the oil by the means of DGA and chemical-physical analysis. The solid insulation system mainly consists of transformerboard. The condition determination of the cellulose can be done by sampling, with is quite expensive and difficult. New dielectric methods which operate on the effect of response function have established in the last years. In this paper the focus should be directed on the mechanism of cellulose ageing and dielectric measurement.
  • Keywords
    ageing; dielectric measurement; life testing; power transformer insulation; transformer oil; DGA; accelerated ageing process; cellulose ageing; chemical-physical analysis; degradation; dielectric measurement; electrical insulation system; mineral oil; moisture determination; multistress load; operational risk; power transformers; reliability; solid insulation system; Aging; Chemical analysis; Dielectrics and electrical insulation; Moisture; Power system reliability; Power transformer insulation; Power transformers; Solids; Thermal degradation; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4244-6298-8
  • Type

    conf

  • DOI
    10.1109/ELINSL.2010.5549775
  • Filename
    5549775