• DocumentCode
    159946
  • Title

    Thermal management: A key point for the integration in solid state lighting systems

  • Author

    Gasse, A. ; Corfa, A. ; Bernabe, S. ; Aitmani, N. ; Lhermet, N. ; Henry, David ; Alibert, P.

  • Author_Institution
    Univ. Grenoble Alpes, Grenoble, France
  • fYear
    2014
  • fDate
    16-18 Sept. 2014
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Solid State Lighting technologies are becoming more and more attractive in the lighting market. Thermal management is a key issue, which impacts efficiency but also colour stability and reliability of LED-based systems. In this paper, we describe and discuss such issues through various examples of different projects by analysing both the heat transfer mechanisms and their impact on the choice of materials and integration technologies. Transient thermal analysis are performed allowing to derive both the junction temperature and the discrete thermal resistances of the systems. The measurements are supported by Infrared thermography as well as Numerical Finite Elements Modelling (ANSYS® software). Results on various LED dies, package configurations, board types are presented with the impact on LED light flux. In addition, we present results on LED light engines based on the Chip On Board technology showing the benefit of this technology. Finally, the optimization of the heat sink is presented on a LED retrofit MR16 lamp.
  • Keywords
    LED lamps; finite element analysis; infrared imaging; thermal analysis; thermal management (packaging); thermal resistance; transient analysis; ANSYS; LED dies; LED light engines; LED light flux; LED-based systems; board types; chip on board technology; discrete thermal resistances; heat transfer mechanisms; infrared thermography; junction temperature; numerical finite elements modelling; package configurations; solid state lighting systems; thermal management; transient thermal analysis; Electrical resistance measurement; Light emitting diodes; Materials; Temperature measurement; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference (ESTC), 2014
  • Conference_Location
    Helsinki
  • Type

    conf

  • DOI
    10.1109/ESTC.2014.6962715
  • Filename
    6962715